Infineon Technologies North America Corp.
308Patents
25Active
308Granted
44Portfolio score
Filing activity: Jul 7, 1997 → Nov 10, 2020 · 22 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6598034B1 | Rule based IP data processing | Electricity | 450 | Expired |
| US6420216B1 | Fuse processing using dielectric planarization pillars | Electricity | 213 | Expired |
| US6426269B1 | Dummy feature reduction using optical proximity effect correction | Physics | 197 | Expired |
| US6665802B1 | Power management and control for a microcontroller | Emerging Cross-Sectional Technologies | 158 | Expired |
| US6482017B1 | EMI-shielding strain relief cable boot and dust cover | Electricity | 143 | Expired |
| US7426134B2 | Sense circuit for resistive memory | Physics | 102 | Active |
| US6177698A | Formation of controlled trench top isolation layers for vertical transistors | Electricity | 100 | Expired |
| US6307622A | Correlation based optical ranging and proximity detector | Physics | 98 | Expired |
| US6532280B1 | Integrated circuit card for computer communication | Electricity | 75 | Expired |
| US6816328B2 | Pseudo-synchronous interpolated timing recovery for a sampled amplitude read channel | Physics | 70 | Expired |
| US6668242B1 | Emulator chip package that plugs directly into the target system | Electricity | 69 | Expired |
| US6594094B2 | Read/write channel | Physics | 61 | Expired |
| US6593240B1 | Two step chemical mechanical polishing process | Electricity | 54 | Expired |
| US6425101B1 | Programmable JTAG network architecture to support proprietary debug protocol | Physics | 54 | Expired |
| US6218298A | Tungsten-filled deep trenches | Electricity | 53 | Expired |
| US6251710A | Method of making a dual damascene anti-fuse with via before wire | Electricity | 52 | Expired |
| US6275096A | Charge pump system having multiple independently activated charge pumps and corresponding method | Electricity | 51 | Expired |
| US7286534B2 | SRAM based cache for DRAM routing table lookups | Electricity | 50 | Expired |
| US6603694B1 | Dynamic memory refresh circuitry | Physics | 50 | Expired |
| US6674684B1 | Multi-bank chip compatible with a controller designed for a lesser number of banks and method of operating | Physics | 48 | Expired |
| US6782465B1 | Linked list DMA descriptor architecture | Physics | 47 | Expired |
| US6335228B1 | Method for making an anti-fuse | Electricity | 46 | Expired |
| US6405273B1 | Data processing device with memory coupling unit | Physics | 46 | Expired |
| US6140208A | Shallow trench isolation (STI) with bilayer of oxide-nitride for VLSI applications | Electricity | 45 | Expired |
| US7031205B2 | Random access memory with post-amble data strobe signal noise rejection | Physics | 44 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.