Wuping Liu
16Patents
3h-index
33Co-inventors
56Inventor score
Filing activity: Dec 23, 2002 → Jul 29, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8358007B2 | Integrated circuit system employing low-k dielectrics and method of manufacture thereof | Electricity | 12 | Active |
| US7601607B2 | Protruded contact and insertion of inter-layer-dielectric material to match damascene hardmask to improve undercut for low-k interconnects | Electricity | 7 | Active |
| US9443761B2 | Methods for fabricating integrated circuits having device contacts | Electricity | 4 | Active |
| US7012022B2 | Self-patterning of photo-active dielectric materials for interconnect isolation | Electricity | 3 | Expired |
| US7276440B2 | Method of fabrication of a die oxide ring | Electricity | 2 | Expired |
| US6995087B2 | Integrated circuit with simultaneous fabrication of dual damascene via and trench | Electricity | 2 | Expired |
| US7153766B2 | Metal barrier cap fabrication by polymer lift-off | Electricity | 2 | Expired |
| US9449834B2 | Method of fabricating semiconductor devices including PMOS devices having embedded SiGe | Electricity | 2 | Active |
| US6967156B2 | Method to fabricate aligned dual damascene openings | Electricity | 1 | Expired |
| US7323408B2 | Metal barrier cap fabrication by polymer lift-off | Electricity | 0 | Expired |
| US7906426B2 | Method of controlled low-k via etch for Cu interconnections | Electricity | 0 | Active |
| US7678586B2 | Structure and method to prevent charge damage from e-beam curing process | Electricity | 0 | Active |
| US7256136B2 | Self-patterning of photo-active dielectric materials for interconnect isolation | Electricity | 0 | Expired |
| US8018061B2 | Integrated circuit hard mask processing system | Electricity | 0 | Active |
| US7615484B2 | Integrated circuit manufacturing method using hard mask | Electricity | 0 | Active |
| US7372156B2 | Method to fabricate aligned dual damascene openings | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.