Patent · US Active

Retention margin program verification

US7652918B2 · kind B2 · utility

7Cited by
2References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 28, 2006
Grant dateJan 26, 2010
Priority date
Expiry dateDec 28, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5621
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory system, comprising an array of storage elements divided into logical blocks and pages within said logical blocks and a managing circuit is provided. The managing circuit is in communication with said array of storage elements and performs programming and reading operations. The programming operations include programming a plurality of multi-state storage data. The reading operations include defining an retention margin between adjacent data thresholds, determining whether bits are present in a portion of the data retention margin, and if the number of bits in the portion of retention margin exceeds a threshold, generating an error.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.