IGBT device and related device having robustness under extreme conditions
US7696600B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 2, 2007 |
| Grant date | Apr 13, 2010 |
| Priority date | — |
| Expiry date | Feb 24, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/107
Abstract
A semiconductor device in the form of an IGBT has a front side contact, a rear side contact, and a semiconductor volume disposed between the front side contact and the rear side contact. The semiconductor volume includes a field stop layer for spatially delimiting an electric field that can be formed in the semiconductor volume. The semiconductor volume further includes a plurality of semiconductor zones, the plurality of semiconductor zones spaced apart from each other and each inversely doped with respect to adjacent areas. The plurality of semiconductor zones are located within the field stop layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.