Deep trench (DT) metal-insulator-metal (MIM) capacitor
US7741188B2 · kind B2 · utility
28Cited by
15References
16Claims
0Family size
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Key dates
| Filing date | Mar 24, 2008 |
| Grant date | Jun 22, 2010 |
| Priority date | — |
| Expiry date | Nov 7, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S438/957
Abstract
A deep trench metal-insulator-metal (MIM) capacitor in an SOI-type substrate. In the deep trench, a layer of TiN, followed by a layer of high-k dielectric, followed by a second layer of TiN. The resulting capacitor is completely buried below the SOI layer, thereby allowing for subsequent structures to be placed over the deep trench.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.