Transistor having a channel with tensile strain and oriented along a crystallographic orientation with increased charge carrier mobility
US7767540B2 · kind B2 · utility
9Cited by
3References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 6, 2006 |
| Grant date | Aug 3, 2010 |
| Priority date | — |
| Expiry date | Apr 23, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/68
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
By appropriately orienting the channel length direction with respect to the crystallographic characteristics of the silicon layer, the stress-inducing effects of strained silicon/carbon material may be significantly enhanced compared to conventional techniques. In one illustrative embodiment, the channel may be oriented along the <100> direction for a (100) surface orientation, thereby providing an electron mobility increase of approximately a factor of four.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.