Method for the simultaneous double-side grinding of a plurality of semiconductor wafers
US7815489B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jul 9, 2007 |
| Grant date | Oct 19, 2010 |
| Priority date | — |
| Expiry date | Jan 2, 2029 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB24B37/08
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A method for the simultaneous double-side grinding of a plurality of semiconductor wafers, involves a process wherein each semiconductor wafer lies such that it is freely moveable in a cutout of one of a plurality of carriers caused to rotate by means of a rolling apparatus and is thereby moved on a cycloidal trajectory, wherein the semiconductor wafers are machined in material-removing fashion between two rotating working disks, wherein each working disk comprises a working layer containing bonded abrasive. The method according to the invention makes it possible, by means of specific kinematics, to produce extremely planar semiconductor wafers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.