Method for programming and erasing an array of NMOS EEPROM cells that minimizes bit disturbances and voltage withstand requirements for the memory array and supporting circuits
US7817474B2 · kind B2 · utility
2Cited by
21References
19Claims
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Key dates
| Filing date | Dec 10, 2008 |
| Grant date | Oct 19, 2010 |
| Priority date | — |
| Expiry date | May 13, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D89/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for programming and erasing an array of NMOS electrically erasable programmable read only memory (EEPROM) cells that minimizes bit disturbances and high voltage requirements for the memory array cells and supporting circuits. In addition, the array of N-channel memory cells may be separated into independently programmable memory segments by creating multiple, electrically isolated P-wells upon which the memory segments are fabricated. The multiple, electrically isolated P-wells may be created, for example, by p-n junction isolation or dielectric isolation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.