Capacitance structures for defeating microchip tampering

US7884625B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Gerald K. Bartley · Rochester, US
• Darryl J. Becker · Rochester, US
• Paul Eric Dahlen · Rochester, US
• Philip Raymond Germann · Oronoco, US
• Andrew Benson Maki · Rochester, US
• Mark O. Maxson · Mantorville, US

Key dates

• Filing date: Jul 29, 2008
• Grant date: Feb 8, 2011
• Expiry date: Apr 15, 2029

Classification

• Technology area (CPC H): Electricity
• CPC primary: H01L2924/3011
• WIPO field: Semiconductors
• WIPO sector: Electrical engineering

Abstract

Apparatus, method and program product may detect an attempt to tamper with a microchip by detecting an unacceptable alteration in a measured capacitance associated with capacitance structures proximate the backside of a microchip. The capacitance structures typically include metallic shapes and may connect using through-silicon vias to active sensing circuitry within the microchip. In response to the sensed change, a shutdown, spoofing, self-destruct or other defensive action may be initiated to protect security sensitive circuitry of the microchip.