Patent · US Active

Method and system for controlling radical distribution

US8038834B2 · kind B2 · utility

10Cited by
9References
15Claims
0Family size

Assignees

Inventors

Key dates

Filing dateApr 6, 2010
Grant dateOct 18, 2011
Priority date
Expiry dateApr 6, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32834
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing system includes a processing chamber, a substrate holder configured to hold a substrate for plasma processing, and a gas injection assembly. The gas injection assembly includes a first evacuation port located substantially in a center of the gas injection assembly and configured to evacuate gases from a central region of the substrate, and a gas injection system configured to inject gases in the process chamber. The plasma processing system also includes a second evacuation port configured to evacuate gases from a peripheral region surrounding the central region of the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.