Patent · US Expired

Device for cleaning CVD device and method of cleaning CVD device

US8043438B2 · kind B2 · utility

2Cited by
5References
1Claims
0Family size

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Key dates

Filing dateMar 12, 2004
Grant dateOct 25, 2011
Priority date
Expiry dateMay 7, 2024

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/4405
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

An apparatus for cleaning a CVD apparatus that can efficiently remove a by-product such as SiO2 or Si3N4 stuck and deposited onto the surface of an internal wall, an electrode, or the like in a reaction chamber in a film forming process, and a method for cleaning a CVD apparatus. A control monitors luminous intensity data of an F radical in a reaction chamber by optical emission spectroscopy and compares the data with calibrated prestored luminous intensity data, and ends cleaning after a predetermined time passes from reaching a luminous intensity saturation point. Furthermore, concentration data of SiF4 in a gas discharged from the reaction chamber are monitored by a Fourier transform infrared spectrometry and compared with prestored concentration data of SiF4 to decide that the predetermined time has passed when a predetermined cleaning end point concentration is reached, thereby ending the cleaning.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.