Patent · US Active

Method of depositing boron nitride and boron nitride-derived materials

US8084105B2 · kind B2 · utility

4Cited by
14References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 19, 2007
Grant dateDec 27, 2011
Priority date
Expiry dateFeb 1, 2029

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/45523
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Methods for forming boron-containing films are provided. The methods include introducing a boron-containing precursor and a nitrogen or oxygen-containing precursor into a chamber and forming a boron nitride or boron oxide film on a substrate in the chamber. In one aspect, the method includes depositing a boron-containing film and then exposing the boron-containing film to the nitrogen-containing or oxygen-containing precursor to incorporate nitrogen or oxygen into the film. The deposition of the boron-containing film and exposure of the film to the precursor may be performed for multiple cycles to obtain a desired thickness of the film. In another aspect, the method includes reacting the boron-containing precursor and the nitrogen-containing or oxygen-containing precursor to chemically vapor deposit the boron nitride or boron oxide film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.