Monolithically integrated IR imaging using rare-earth up conversion materials
US8178841B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 28, 2009 |
| Grant date | May 15, 2012 |
| Priority date | — |
| Expiry date | Apr 3, 2030 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E10/547
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
Infrared imaging at wavelengths longer than the silicon bandgap energy (>1100 nm) typically require expensive focal plane arrays fabricated from compound semiconductors (InSb or HgCdTe) or use of slower silicon microbolometer technology. Furthermore, these technologies are available in relatively small array sizes, whereas silicon focal plane arrays are easily available with 10 megapixels or more array size. A new technique is disclosed to up convert infrared light to wavelengths detectable by silicon focal plane arrays, or other detector technologies, thereby enabling a low-cost, high pixel count infrared imaging system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.