Stacked trench metal-oxide-semiconductor field effect transistor device
US8183629B2 · kind B2 · utility
8Cited by
47References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 18, 2008 |
| Grant date | May 22, 2012 |
| Priority date | — |
| Expiry date | Feb 26, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/117
Abstract
Embodiments of the present invention are directed toward a trench metal-oxide-semiconductor field effect transistor (TMOSFET) device. The TMOSFET device includes a source-side-gate TMOSFET coupled to a drain-side-gate TMOSFET 1203. A switching node metal layer couples the drain of the source-side-gate TMOSFET to the source of the drain-side-gate TMOSFET so that the TMOSFETs are packaged as a stacked or lateral device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.