Method and apparatus for reducing semiconductor package tensile stress
US8212346B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 28, 2008 |
| Grant date | Jul 3, 2012 |
| Priority date | — |
| Expiry date | Nov 16, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/12044
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor package is provided having reduced tensile stress. The semiconductor package includes a package substrate and a semiconductor die. The semiconductor die is coupled electrically and physically to the package substrate and includes a stress relieving layer incorporated therein. The stress relieving layer has a predetermined structure and a predetermined location within the semiconductor die for reducing tensile stress of the semiconductor package during heating and cooling of the semiconductor package.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.