Integrated circuit memory having assisted access and method therefor
US8315117B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2009 |
| Grant date | Nov 20, 2012 |
| Priority date | — |
| Expiry date | Feb 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/41
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory and method for access the memory are provided. A first test is used to test memory elements to determine a lowest power supply voltage at which all the memory elements will operate to determine a weak memory element. Redundancy is used to substitute a redundant memory element for the weak memory element. The weak memory element is designated as a test element. In response to receiving a request to change a power supply voltage provided to the memory elements, a second test is used to test the test element to determine if the test element will function correctly at a new power supply voltage. If the test element passes the second test, the memory elements are accessed at the new power supply voltage. If the test element fails the second test, the memory elements are accessed using an access assist operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.