Patent · US Active

Plasma reactor with uniform process rate distribution by improved RF ground return path

US8360003B2 · kind B2 · utility

3Cited by
1References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 13, 2009
Grant dateJan 29, 2013
Priority date
Expiry dateJun 24, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F71/00
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

In a plasma reactor having an RF plasma source power applicator at its ceiling, an integrally formed grid liner includes a radially extending plasma confinement ring and an axially extending side wall liner. The plasma confinement ring extends radially outwardly near the plane of a workpiece support surface from a pedestal side wall, and includes an annular array of radial slots, each of the slots having a narrow width corresponding to an ion collision mean free path length of a plasma in the chamber. The side wall liner covers an interior surface of the chamber side wall and extends axially from a height near a height of said workpiece support surface to the chamber ceiling.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.