Molecular bonding method with cleaning with hydrofluoric acid in vapor phase and rinsing with deionized water
US8382933B2 · kind B2 · utility
0Cited by
5References
11Claims
0Family size
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Key dates
| Filing date | Feb 8, 2008 |
| Grant date | Feb 26, 2013 |
| Priority date | — |
| Expiry date | Feb 12, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/187
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Adhesion by molecular bonding of two free surfaces of first and second substrates, for example formed by monocrystalline silicon wafers, comprises at least successively:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.