Method of processing a workpiece in a plasma reactor with independent wafer edge process gas injection
US8383002B2 · kind B2 · utility
2Cited by
8References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 24, 2010 |
| Grant date | Feb 26, 2013 |
| Priority date | — |
| Expiry date | Mar 25, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/3065
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The disclosure concerns a method of processing a workpiece or in a plasma reactor chamber, using independent gas injection at the wafer edge.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.