Patent · US Active

Contact optimization for enhancing stress transfer in closely spaced transistors

US8384161B2 · kind B2 · utility

3Cited by
1References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 25, 2010
Grant dateFeb 26, 2013
Priority date
Expiry dateApr 7, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

By appropriately designing the geometric configuration of a contact level of a sophisticated semiconductor device, the tensile stress level of contact elements in N-channel transistors may be increased, while the tensile strain component of contact elements caused in the P-channel transistor may be reduced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.