Patent · US Active

Lithographic apparatus and device manufacturing method

US8427629B2 · kind B2 · utility

0Cited by
22References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 30, 2010
Grant dateApr 23, 2013
Priority date
Expiry dateMar 16, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70341
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An immersion lithographic projection apparatus has a liquid confinement structure configured to at least partly confine liquid to a space between a projection system and a substrate, the confinement structure having a buffer surface, when in use, positioned in close proximity to a plane substantially comprising the upper surface of the substrate and of a substrate table holding the substrate, to define a passage having a flow resistance. A recess is provided in the buffer surface, the recess, when in use, being normally full of immersion liquid to enable rapid filling of a gap between the substrate and substrate table as the gap moves under the buffer surface. The recess may be annular or radial and a plurality of recesses may be provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.