Patent · US Active

Chemical-mechanical planarization pad including patterned structural domains

US8435099B2 · kind B2 · utility

0Cited by
8References
14Claims
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Assignee

Inventors

Key dates

Filing dateJan 27, 2010
Grant dateMay 7, 2013
Priority date
Expiry dateAug 26, 2031

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/24
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

An aspect of the present disclosure relates to a chemical mechanical planarization pad including a first domain and a second continuous domain wherein the first domain includes discrete elements regularly spaced within the second continuous domain. The pad may be formed by forming a plurality of openings for a first domain within a second continuous domain of the pad, wherein the openings are regularly spaced within the second domain, and forming the first domain within the plurality of openings in second continuous domain. In addition, the pad may be used in polishing a substrate with a polishing slurry.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.