David Adam Wells
14Patents
4h-index
7Co-inventors
45Inventor score
Filing activity: Jul 19, 2007 → Nov 4, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9162341B2 | Chemical-mechanical planarization pad including patterned structural domains | Performing Operations; Transporting | 15 | Active |
| US8684794B2 | Chemical mechanical planarization pad with void network | Performing Operations; Transporting | 15 | Active |
| US8172648B2 | Chemical-mechanical planarization pad | Performing Operations; Transporting | 13 | Active |
| US9375822B2 | Polishing pad having micro-grooves on the pad surface | Performing Operations; Transporting | 12 | Active |
| US8137166B2 | Polishing pad having micro-grooves on the pad surface | Performing Operations; Transporting | 3 | Active |
| US7985121B2 | Chemical-mechanical planarization pad having end point detection window | Performing Operations; Transporting | 2 | Active |
| US8430721B2 | Chemical-mechanical planarization pad | Performing Operations; Transporting | 1 | Active |
| US8491360B2 | Three-dimensional network in CMP pad | Performing Operations; Transporting | 1 | Active |
| US8758659B2 | Method of grooving a chemical-mechanical planarization pad | Performing Operations; Transporting | 1 | Active |
| US8900036B2 | Polishing pad having micro-grooves on the pad surface | Performing Operations; Transporting | 1 | Active |
| US9796063B2 | Multi-layered chemical-mechanical planarization pad | Performing Operations; Transporting | 0 | Active |
| US8435099B2 | Chemical-mechanical planarization pad including patterned structural domains | Performing Operations; Transporting | 0 | Active |
| US8377351B2 | Polishing pad with controlled void formation | Emerging Cross-Sectional Technologies | 0 | Active |
| US8790165B2 | Multi-layered chemical-mechanical planarization pad | Performing Operations; Transporting | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.