Methods for reducing the width of the unbonded region in SOI structures
US8440541B2 · kind B2 · utility
6Cited by
14References
29Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 4, 2011 |
| Grant date | May 14, 2013 |
| Priority date | — |
| Expiry date | Feb 4, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/02052
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The disclosure relates to preparation of silicon on insulator structures with reduced unbonded regions and to methods for producing such wafers by minimizing the roll-off amount (ROA) of the handle and donor wafers. Methods for polishing wafers are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.