Microelectronic device, in particular back side illuminated image sensor, and production process
US8524522B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 9, 2010 |
| Grant date | Sep 3, 2013 |
| Priority date | — |
| Expiry date | Dec 30, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F77/1226
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A process for producing a microelectronic device includes producing a first semiconductor substrate which includes a first layer and a second layer present between a first side and a second side of the substrate. First electronic components and an interconnecting part are produced on and above the second side. The substrate is then thinned by a first selective etch applied from the first side and stopping on the first layer followed by a second selective etch stopping on the second layer. A second substrate is attached over the interconnecting part. The electronic components may comprise optoelectronic devices which are illuminated through the second layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.