Silicon-on-insulator substrate and method of forming
US8536035B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 1, 2012 |
| Grant date | Sep 17, 2013 |
| Priority date | — |
| Expiry date | Feb 1, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/76254
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Silicon-on-insulator (SOI) structures and related methods of forming such structures. In one case, a method includes providing a silicon-on-insulator (SOI) handle substrate having: a substantially uniform resistivity profile along a depth of the handle substrate; and an interstitial oxygen (Oi) concentration of less than approximately 10 parts per million atoms (ppma). The method further includes counter-doping a surface region of the handle, causing the surface region to have a resistivity greater than approximately 3 kOhm-cm, and joining the surface region of the handle substrate with a donor wafer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.