Patent · US Active

Silicon-on-insulator substrate and method of forming

US8536035B2 · kind B2 · utility

2Cited by
8References
19Claims
0Family size

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Key dates

Filing dateFeb 1, 2012
Grant dateSep 17, 2013
Priority date
Expiry dateFeb 1, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76254
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Silicon-on-insulator (SOI) structures and related methods of forming such structures. In one case, a method includes providing a silicon-on-insulator (SOI) handle substrate having: a substantially uniform resistivity profile along a depth of the handle substrate; and an interstitial oxygen (Oi) concentration of less than approximately 10 parts per million atoms (ppma). The method further includes counter-doping a surface region of the handle, causing the surface region to have a resistivity greater than approximately 3 kOhm-cm, and joining the surface region of the handle substrate with a donor wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.