Patent · US Active

Methods and apparatus for determining electromagnetic scattering properties and structural parameters of periodic structures

US8645109B2 · kind B2 · utility

2Cited by
3References
17Claims
0Family size

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Key dates

Filing dateNov 29, 2010
Grant dateFeb 4, 2014
Priority date
Expiry dateFeb 1, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70625
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Numerical calculation of electromagnetic scattering properties and structural parameters of periodic structures is disclosed. A reflection coefficient has a representation as a bilinear or sesquilinear form. Computations of reflection coefficients and their derivatives for a single outgoing direction can benefit from an adjoint-state variable. Because the linear operator is identical for all angles of incidence that contribute to the same outgoing wave direction, there exists a single adjoint-state variable that generates all reflection coefficients from all incident waves that contribute to the outgoing wave. This adjoint-state variable can be obtained by numerically solving a single linear system, whereas one otherwise would need to solve a number of linear systems equal to the number of angles of incidence.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.