Patent · US Active

Method for compensation of variability in chemical mechanical polishing consumables

US8758085B2 · kind B2 · utility

2Cited by
9References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 7, 2011
Grant dateJun 24, 2014
Priority date
Expiry dateSep 3, 2032

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/005
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

Apparatus and methods for conditioning a polishing pad in a CMP system are provided. In one embodiment, a method includes performing a pre-polish process including urging a conditioner disk against a polishing surface of a polishing pad disposed in a polishing station, moving the conditioner disk relative to the polishing pad in a sweep pattern across the polishing surface while monitoring a rotational force value required to move the conditioner disk relative to the polishing pad, determining a metric indicative of an interaction between the conditioner disk and the polishing surface from the rotational force value, adjusting a polishing recipe in response to the metric, and polishing one or more substrates using the adjusted polishing recipe.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.