Patent · US Active

In-field block retiring

US8767467B2 · kind B2 · utility

5Cited by

17References

20Claims

0Family size

Assignee

Micron Technology, Inc. · US

Inventors

Krishna K. Parat · Palo Alto, US
Akira Goda · Boise, US
Koichi Kawal · Yokohama, JP
Brian J. Soderling · Eagle, US
Jeremy Binfet · Boise, US
Arnaud A. Furnemont · Boise, US
Tejas Krishnamohan · Palo Alto, US
Tyson M. Stichka · Boise, US
Giuseppina Puzzilli · Boise, US

Key dates

Filing date	Aug 19, 2013
Grant date	Jul 1, 2014
Priority date	—
Expiry date	Aug 19, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/789
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Memory devices and methods are disclosed, including a method involving erasing a block of memory cells. After erasing the block, and before subsequent programming of the block, a number of bad strings in the block are determined based on charge accumulation on select gate transistors. The block is retired from use if the number of bad strings exceeds a threshold. Additional embodiments are disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.