Patent · US Active

Developing method and developing apparatus

US8865396B2 · kind B2 · utility

3Cited by
1References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 27, 2009
Grant dateOct 21, 2014
Priority date
Expiry dateJul 23, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/3021
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A developing method including a developing step in which, while a wafer horizontally held by a spin chuck is being rotated, the wafer is developed by supplying a developer onto a surface of the wafer, wherein provided before the developing step is a pre-wetting step in which, simultaneously with the developer being supplied from a first nozzle that is located on a position near a central part of the surface of the rotating wafer, a deionized water as a second liquid is supplied from a second nozzle that is located on a position nearer to an outer peripheral part of the wafer than the first nozzle, to thereby spread out the developer in the rotating direction of the wafer by a wall that is formed by the deionized water flowing to the outer peripheral side of the wafer with the rotation of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.