Memory device with background built-in self-testing and background built-in self-repair
US9037928B2 · kind B2 · utility
22Cited by
9References
76Claims
0Family size
Assignee
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Key dates
| Filing date | Jan 2, 2013 |
| Grant date | May 19, 2015 |
| Priority date | — |
| Expiry date | Jan 2, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0409
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A memory device with background built-in self-testing (BBIST) includes a plurality of memory blocks; a memory buffer to offload data from one of the plurality of memory blocks temporarily; and a memory block stress controller to control a stress test applied to the one of the memory blocks when the data is temporarily offloaded on the memory buffer. The stress test tests for errors in the one of the plurality of the memory blocks.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.