Detecting chip alterations with light emission
US9075106B2 · kind B2 · utility
4Cited by
16References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 30, 2009 |
| Grant date | Jul 7, 2015 |
| Priority date | — |
| Expiry date | May 20, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An emission map of a circuit to be tested for alterations is obtained by measuring the physical circuit to be tested. An emission map of a reference circuit is obtained by measuring a physical reference circuit or by simulating the emissions expected from the reference circuit. The emission map of the circuit to be tested is compared with the emission map of the reference circuit, to determine presence of alterations in the circuit to be tested, as compared to the reference circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.