Programmable active thermal control

US9152517B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Harold W. Chase · Cedar Park, US
• Dennis R. Conti · South Burlington, US
• James M. Crafts · Warren, US
• David L. Gardell · Saint Albans, US
• Andrew T. Holle · Austin, US
• Adrian Patrascu · Austin, US
• Jody Van Horn · Underhill, US

Key dates

• Filing date: Apr 21, 2011
• Grant date: Oct 6, 2015
• Expiry date: Nov 2, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2877
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

Test equipment provides interrupt capability to automatic testing as a means of actively controlling temperature of the device under test. A processor coupled to memory is responsive to computer-executable instructions contained in the memory. A test socket is coupled to a device under test and coupled to the processor. The processor is configured to interrupt an application pattern running on the device under test. In response to interrupting the application pattern, the processor is configured to cause a control pattern to run on the device under test and then cause the application pattern to restart running from the point of interruption on the device under test.