Dennis R. Conti
15Patents
5h-index
34Co-inventors
66Inventor score
Filing activity: Mar 10, 1986 → Mar 12, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5280625A | Communication system and method for linking data terminals and their host computers through a satellite or other wide area network | Electricity | 79 | Expired |
| US6847203B1 | Applying parametric test patterns for high pin count ASICs on low pin count testers | Physics | 73 | Expired |
| US6275051A | Segmented architecture for wafer test and burn-in | Physics | 73 | Expired |
| US7388869B2 | System and method for routing among private addressing domains | Electricity | 62 | Expired |
| US4751656A | Method for choosing replacement lines in a two dimensionally redundant array | Physics | 28 | Expired |
| US10261108B2 | Low force wafer test probe with variable geometry | Physics | 3 | Active |
| US11322473B2 | Interconnect and tuning thereof | Electricity | 1 | Active |
| US7265561B2 | Device burn in utilizing voltage control | Physics | 1 | Expired |
| US11561243B2 | Compliant organic substrate assembly for rigid probes | Electricity | 0 | Active |
| US9152517B2 | Programmable active thermal control | Physics | 0 | Active |
| US10670653B2 | Integrated circuit tester probe contact liner | Physics | 0 | Active |
| US10444260B2 | Low force wafer test probe | Physics | 0 | Active |
| US11009545B2 | Integrated circuit tester probe contact liner | Physics | 0 | Active |
| US10663487B2 | Low force wafer test probe with variable geometry | Physics | 0 | Active |
| US11029334B2 | Low force wafer test probe | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.