James M. Crafts
7Patents
2h-index
29Co-inventors
51Inventor score
Filing activity: Jan 29, 1999 → Aug 4, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6275051A | Segmented architecture for wafer test and burn-in | Physics | 73 | Expired |
| US8734006B2 | Calibration of an on-die thermal sensor | Physics | 9 | Active |
| US9285417B2 | Low-voltage IC test for defect screening | Emerging Cross-Sectional Technologies | 2 | Active |
| US11422611B2 | Adaptive frequency optimization in processors | Emerging Cross-Sectional Technologies | 0 | Active |
| US12141759B2 | Determining utility infrastructure and connectivity interruptions | Performing Operations; Transporting | 0 | Active |
| US10509457B2 | Adaptive frequency optimization in processors | Emerging Cross-Sectional Technologies | 0 | Active |
| US9152517B2 | Programmable active thermal control | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.