Patent · US Active

System and method for dual-sided sputter etch of substrates

US9165587B2 · kind B2 · utility

6Cited by
46References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 5, 2008
Grant dateOct 20, 2015
Priority date
Expiry dateJul 23, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3438
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A system is provided for etching patterned media disks. A movable electrode is utilized to perform sputter etch. The electrode moves to near or at slight contact to the substrate so as to couple RF energy to the disk. The material to be etched may be metal, e.g., Co/Pt/Cr or similar metals. The substrate is held vertically in a carrier and both sides are etched serially. That is, one side is etched in one chamber and then in the next chamber the second side is etched. An isolation valve is disposed between the two chambers and the disk carrier moves the disks between the chambers. The carrier may be a linear drive carrier, using, e.g., magnetized wheels and linear motors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.