Zoned erase verify in three dimensional nonvolatile memory
US9312026B2 · kind B2 · utility
8Cited by
13References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 22, 2014 |
| Grant date | Apr 12, 2016 |
| Priority date | — |
| Expiry date | Aug 22, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10B43/27
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a three-dimensional nonvolatile memory, when a block erase failure occurs, zones within a block may be separately verified to see if some zones pass verification. Zones that pass may be designated as good zones and may subsequently be used to store user data while bad zones in the same block may be designated as bad and may not be used for subsequent storage of user data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.