Method and apparatus for supply voltage glitch detection in a monolithic integrated circuit device
US9523722B2 · kind B2 · utility
3Cited by
12References
19Claims
0Family size
Assignee
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Key dates
| Filing date | Jun 2, 2014 |
| Grant date | Dec 20, 2016 |
| Priority date | — |
| Expiry date | Nov 30, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F1/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A monolithic integrated circuit device may include a supply voltage glitch detector for detecting improper supply voltage conditions. Advantageously, the detection threshold of the supply voltage glitch detector is adaptively set based on the mode of operation of the device or a particular part of the device, which is internally known to the device based on certain inputs received by the device, such as commands, interrupts, control signals, and so forth.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.