Isometric test compression with low toggling activity
US9651622B2 · kind B2 · utility
1Cited by
2References
20Claims
0Family size
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Inventors
Key dates
| Filing date | Mar 9, 2015 |
| Grant date | May 16, 2017 |
| Priority date | — |
| Expiry date | Apr 3, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318583
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various aspects of the disclosed technology relate to techniques of creating test templates for test pattern generation. Residual test cubes for a plurality of faults are first generated based on a signal probability analysis of a circuit design. Test templates are then generated based on merging the residual test cubes. Finally, a plurality of test patterns and/or compressed test cubes are generated based on one of the test templates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.