Patent · US Active

Apparatus and techniques to treat substrates using directional plasma and reactive gas

US9706634B2 · kind B2 · utility

10Cited by
2References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 2015
Grant dateJul 11, 2017
Priority date
Expiry dateDec 16, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/327
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An apparatus to treat a substrate. The apparatus may include a reactive gas source having a reactive gas outlet disposed in a process chamber, the reactive gas outlet to direct a first reactive gas to the substrate; a plasma chamber coupled to the process chamber and including an extraction plate having an extraction aperture extending along a first direction, disposed within the process chamber and movable along a second direction perpendicular to the first direction between a first position facing the reactive gas source and a second position facing the extraction aperture; and a gas flow restrictor disposed between the reactive gas outlet and the extraction aperture, the gas flow restrictor defining a differential pumping channel between at least the plasma chamber and substrate stage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.