Substrates with buried isolation layers and methods of formation thereof
US9875926B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 29, 2015 |
| Grant date | Jan 23, 2018 |
| Priority date | — |
| Expiry date | Nov 29, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/76297
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method for fabricating a semiconductor device includes forming an opening in a first epitaxial lateral overgrowth region to expose a surface of the semiconductor substrate within the opening. The method further includes forming an insulation region at the exposed surface of the semiconductor substrate within the opening and filling the opening with a second semiconductor material to form a second epitaxial lateral overgrowth region using a lateral epitaxial growth process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.