Patent · US Active

Structure for thermally assisted MRAM

US9917247B2 · kind B2 · utility

2Cited by
1References
20Claims
0Family size

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Key dates

Filing dateNov 9, 2016
Grant dateMar 13, 2018
Priority date
Expiry dateNov 9, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N50/85
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A mechanism is provided for fabricating a thermally assisted magnetoresistive random access memory device. A bottom thermal barrier is formed on a bottom contact. A magnetic tunnel junction is formed on the bottom thermal barrier. The magnetic tunnel junction includes a top ferromagnetic layer formed on a tunnel barrier. The tunnel barrier is formed on a bottom ferromagnetic layer. A top thermal barrier is formed on the top ferromagnetic layer. A top contact is formed on the top thermal barrier. The top contact is reduced to a first diameter. The tunnel barrier and the bottom ferromagnetic layer each have a second diameter. The first diameter of the top contact is smaller than the second diameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.