Method of forming a semiconductor device and semiconductor device
US9954065B2 · kind B2 · utility
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1References
20Claims
0Family size
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Key dates
| Filing date | Nov 9, 2015 |
| Grant date | Apr 24, 2018 |
| Priority date | — |
| Expiry date | Nov 9, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/8503
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
In accordance with a method of forming a semiconductor device, an auxiliary structure is formed at a first surface of a silicon semiconductor body. A semiconductor layer is formed on the semiconductor body at the first surface. Semiconductor device elements are formed at the first surface. The semiconductor body is then removed from a second surface opposite to the first surface at least up to an edge of the auxiliary structure oriented to the second surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.