Patent · US Active

Systems and methods for internal surface conditioning assessment in plasma processing equipment

US9966240B2 · kind B2 · utility

100Cited by
251References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 14, 2014
Grant dateMay 8, 2018
Priority date
Expiry dateJun 7, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L22/26
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

In an embodiment, a plasma source includes a first electrode, configured for transfer of one or more plasma source gases through first perforations therein; an insulator, disposed in contact with the first electrode about a periphery of the first electrode; and a second electrode, disposed with a periphery of the second electrode against the insulator such that the first and second electrodes and the insulator define a plasma generation cavity. The second electrode is configured for movement of plasma products from the plasma generation cavity therethrough toward a process chamber. A power supply provides electrical power across the first and second electrodes to ignite a plasma with the one or more plasma source gases in the plasma generation cavity to produce the plasma products. One of the first electrode, the second electrode and the insulator includes a port that provides an optical signal from the plasma.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.