Method for forming a semiconductor device and a semiconductor device
US9972704B2 · kind B2 · utility
1Cited by
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16Claims
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Key dates
| Filing date | Nov 9, 2015 |
| Grant date | May 15, 2018 |
| Priority date | — |
| Expiry date | Nov 9, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D12/032
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method for forming a semiconductor device comprises implanting a defined dose of protons into a semiconductor substrate and tempering the semiconductor substrate according to a defined temperature profile. At least one of the defined dose of protons and the defined temperature profile is selected depending on a carbon-related parameter indicating information on a carbon concentration within at least a part of the semiconductor substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.