Patent · US Expired

Electrostatic chuck with improved spacing and charge migration reduction mask

USD420022S · kind S · design

25Cited by
1References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 24, 1997
Grant dateFeb 1, 2000
Priority date
Expiry dateFeb 1, 2014

Classification

  • Technology area (CPC —)General

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.