FOCUS-EBEAM TECHNOLOGY (BEIJING) CO., LTD.
15Patents
15Active
15Granted
47Portfolio score
Filing activity: May 21, 2014 → Jan 26, 2022
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10777382B2 | Low voltage scanning electron microscope and method for specimen observation | Electricity | 8 | Active |
| US11075056B2 | Scanning electron microscope objective lens system and method for specimen observation | Electricity | 3 | Active |
| US11798781B2 | Microscope | Electricity | 1 | Active |
| US12224153B2 | Electron microscope | Electricity | 0 | Active |
| US9464967B2 | Microtomic system and process utilizing electrostatic force to handle sample sections | Emerging Cross-Sectional Technologies | 0 | Active |
| US10879036B2 | Charged particle beam system, opto-electro simultaneous detection system and method | Electricity | 0 | Active |
| US9797813B2 | Microtomic system and process using semiconductor chip grid | Emerging Cross-Sectional Technologies | 0 | Active |
| US11598732B2 | Imaging system and method for specimen detection | Physics | 0 | Active |
| US11508548B2 | Scanning electron microscope | Electricity | 0 | Active |
| US9719889B2 | Microtomic system and process utilizing electrostatic force to handle sample sections | Emerging Cross-Sectional Technologies | 0 | Active |
| US12315694B2 | Electron beam system | Electricity | 0 | Active |
| US10923312B2 | Magnetic lens and exciting current control method | Electricity | 0 | Active |
| US10699874B2 | Vacuum condition controlling apparatus, system and method for specimen observation | Electricity | 0 | Active |
| US10903039B2 | Vacuum condition processing apparatus, system and method for specimen observation | Electricity | 0 | Active |
| US11145487B2 | Scanning electron microscope with composite detection system and specimen detection method | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.