Park Scientific Instruments
14Patents
0Active
14Granted
29Portfolio score
Filing activity: Mar 13, 1991 → Aug 22, 1997
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5376790A | Scanning probe microscope | Emerging Cross-Sectional Technologies | 139 | Expired |
| US5672816A | Large stage system for scanning probe microscopes and other instruments | Emerging Cross-Sectional Technologies | 125 | Expired |
| US5714756A | Scanning probe microscope having a single viewing device for on-axis and oblique angle views | Emerging Cross-Sectional Technologies | 89 | Expired |
| US5444244A | Piezoresistive cantilever with integral tip for scanning probe microscope | Emerging Cross-Sectional Technologies | 62 | Expired |
| US5743998A | Process for transferring microminiature patterns using spin-on glass resist media | Emerging Cross-Sectional Technologies | 60 | Expired |
| US5157251A | Scanning force microscope having aligning and adjusting means | Emerging Cross-Sectional Technologies | 48 | Expired |
| US5811821A | Single axis vibration reducing system | Emerging Cross-Sectional Technologies | 37 | Expired |
| US5448399A | Optical system for scanning microscope | Emerging Cross-Sectional Technologies | 29 | Expired |
| US5854487A | Scanning probe microscope providing unobstructed top down and bottom up views | Emerging Cross-Sectional Technologies | 20 | Expired |
| US5861624A | Atomic force microscope for attachment to optical microscope | Emerging Cross-Sectional Technologies | 16 | Expired |
| USRE35514E | Scanning force microscope having aligning and adjusting means | General | 16 | Expired |
| US5877891A | Scanning probe microscope having a single viewing device for on-axis and oblique optical views | Emerging Cross-Sectional Technologies | 15 | Expired |
| US6130427A | Scanning probe microscope with multimode head | Emerging Cross-Sectional Technologies | 13 | Expired |
| US5866902A | Atomic force microscope with integrated optics for attachment to optical microscope | General | 0 | Revoked |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.