Qcept Technologies, Inc.
13Patents
7Active
13Granted
39Portfolio score
Filing activity: Jul 29, 2003 → Jan 26, 2010 · 7 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7107158B2 | Inspection system and apparatus | Physics | 10 | Expired |
| US7634365B2 | Inspection system and apparatus | Physics | 9 | Active |
| US6957154B2 | Semiconductor wafer inspection system | Physics | 6 | Expired |
| US7752000B2 | Calibration of non-vibrating contact potential difference measurements to detect surface variations that are perpendicular to the direction of sensor motion | Electricity | 6 | Active |
| US7103482B2 | Inspection system and apparatus | Physics | 4 | Expired |
| US7308367B2 | Wafer inspection system | Physics | 4 | Expired |
| US7337076B2 | Inspection system and apparatus | Physics | 4 | Active |
| US7092826B2 | Semiconductor wafer inspection system | Physics | 3 | Expired |
| US7659734B2 | Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination | Physics | 2 | Active |
| US7900526B2 | Defect classification utilizing data from a non-vibrating contact potential difference sensor | Electricity | 1 | Active |
| US7379826B2 | Semiconductor wafer inspection system | Physics | 1 | Active |
| US8275564B2 | Patterned wafer inspection system using a non-vibrating contact potential difference sensor | Electricity | 1 | Active |
| US7152476B2 | Measurement of motions of rotating shafts using non-vibrating contact potential difference sensor | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.