Ridgetop Group, Inc.
9Patents
6Active
9Granted
40Portfolio score
Filing activity: Nov 19, 2003 → Jan 28, 2016 · 4 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7271608B1 | Prognostic cell for predicting failure of integrated circuits | Physics | 55 | Expired |
| US7501832B2 | Method and circuit for the detection of solder-joint failures in a digital electronic package | Physics | 27 | Active |
| US7239163B1 | Die-level process monitor and method | Physics | 20 | Expired |
| US7196294B2 | Method and resistive bridge circuit for the detection of solder-joint failures in a digital electronic package | Electricity | 10 | Expired |
| US8030943B2 | Circuit for the detection of solder-joint failures in a digital electronic package | Physics | 2 | Active |
| US10082535B2 | Programmable test structure for characterization of integrated circuit fabrication processes | Electricity | 1 | Active |
| US7619908B2 | Prognostic health monitoring in switch-mode power supplies with voltage regulation | Emerging Cross-Sectional Technologies | 1 | Active |
| US9275187B2 | Programmable test chip, system and method for characterization of integrated circuit fabrication processes | Physics | 1 | Active |
| US8134373B1 | Apparatus and method for detecting performance variations | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.